epiluminescence microscopy

(redirected from surface microscopy)

epiluminescence microscopy

low-power microscopy (×50-100), commonly a television microscope applied to a glass slide covering mineral oil on the surface of a skin lesion, for example, to determine malignancy in pigmented lesions.
Synonym(s): surface microscopy

dermoscopy

The examination of the skin surface using a dermoscope.

ep·i·lum·i·nes·cence mi·cros·co·py

(ep'i-lū-mi-nes'ĕns mī-kros'kŏ-pē)
Low-power microscopy (×50-100), commonly a television microscope, applied to a glass slide covering mineral oil on the surface of a skin lesion, e.g., to determine malignancy in pigmented lesions.
Synonym(s): surface microscopy.

dermoscopy

; epiluminescence microscopy diagnostic technique to demonstrate early malignant changes within pigmented nail lesions, or to identify dermal vascular changes in scleroderma and systemic lupus erythematosus
References in periodicals archive ?
Other activities included a CSI-style forensic investigation using the advance surface microscopy of spent cartridge cases to identify the perpetrator of a fictional crime.
True Surface Microscopy combines confocal Raman microscopy for optical and chemical imaging with optical pro-filometry for topographic large-area imaging in a single integrated system.
True Surface Microscopy, a new technique developed by WITec GmbH, Ulna, Germany, combines confocal Raman microscopy for optical and chemical imaging with optical profilometry for topographic large-area imaging in a single integrated system.
The 74 primary care physicians in the study completed a baseline test that included 50 melanomas and 50 atypical pigmented non-melanomas, with matched clinical and surface microscopy photographs.
handyscope gives a magnified, polarized view on the skin, combining skin surface microscopy with mobility and communication technology.
The True Surface Microscopy method from WITec GmbH, Ulm, Germany, extends Raman imaging to large-scale (more than 1 square mm) samples without extensive tilt alignment or sample preparation, and without comprising the advantages of confocal imaging.
In these cases, True Surface Microscopy is a solution, allowing confocal Raman imaging guided by surface topography.
True Surface Microscopy uses the principle of a confocal chromatic sensor as shown in figure 1.
The topographic sensor used for True Surface Microscopy could be a supplement to atomic force microscopy (AFM), which provides topographic information on sample areas less than 100 [micro]m with precision of less than 1 nm.
The capabilities of True Surface Microscopy can be demonstrated in measurements on an electric circuit board.
WITec has launched the True Surface Microscopy option with an integrated sensor for optical profilometry.

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