True Surface Microscopy
, a new technique developed by WITec GmbH, Ulna, Germany, combines confocal Raman microscopy for optical and chemical imaging with optical profilometry for topographic large-area imaging in a single integrated system.
The True Surface Microscopy method from WITec GmbH, Ulm, Germany, extends Raman imaging to large-scale (more than 1 square mm) samples without extensive tilt alignment or sample preparation, and without comprising the advantages of confocal imaging.
In these cases, True Surface Microscopy is a solution, allowing confocal Raman imaging guided by surface topography.
True Surface Microscopy uses the principle of a confocal chromatic sensor as shown in figure 1.
The topographic sensor used for True Surface Microscopy could be a supplement to atomic force microscopy (AFM), which provides topographic information on sample areas less than 100 [micro]m with precision of less than 1 nm.
The capabilities of True Surface Microscopy can be demonstrated in measurements on an electric circuit board.