10th International Conference on Secondary Ion Mass Spectrometry
SIMS X, Wiley, Chichester, U.K.
(4.) Colton, R.J., "Molecular Secondary Ion Mass Spectrometry
We used three microbeam techniques, electron probe microanalysis (EPMA), laser ablation inductively coupled-mass spectrometry (LA ICP-MS), and secondary ion mass spectrometry
(SIMS) to determine (to first order) the minor and trace element characteristics of the glasses.
Secondary ion mass spectrometry
(SIMS) is a surface-analysis technique that increasingly is being used in a wide variety of applications, including the study of semiconductor thin films, metallurgical grain structures, polymers, and organic materials.
These include: X-ray photoelectron spectroscopy (xPs), scanning probes such as atomic force microscopy (AFM), infrared and Raman spectroscopies, and time-of-flight secondary ion mass spectrometry
(ToF-SIMS), to name but a few.
Tenders are invited for Surface Analysis Instrumentation Partnership including X-ray Photoelectron Spectroscopy (XPS), Scanning Auger Microscope/Auger Electron Spectroscopy (SAM/AES) and Time of Flight Secondary Ion Mass Spectrometry
The topics include nanoscale secondary ion mass spectrometry
as an analytical tool in the geosciences, advances in fluorescence spectroscopy for petroleum geosciences, developing and using catalytic hydropyrolysis as an analytical tool for organic geochemical applications, microscale sealed vessel pyrolysis, the development and initial biogeochemical applications of compound-specific sulfur isotope analysis, and applications of liquid chromatography-isotope ratio mass spectrometry in geochemistry and archaeological science.
Cluster secondary ion mass spectrometry
; principles and applications.
Laskaris and his colleagues turned to a method called obsidian hydration dating (OHD) combined with a newer technique known as secondary ion mass spectrometry
of surface saturation (SIMS-SS) to determine how much water had penetrated the obsidian surfaces that were exposed to the air by prehistoric humans who were chipping the rocks to make tools and weapons.
A particularly lengthy paper reviews recent progress in using time-of-flight secondary ion mass spectrometry
(ToF-SIMS) for analyzing biological samples.
As of August, Millbrook Instruments had sold 11 of its chemical microscopes, which utilize secondary ion mass spectrometry
, including two sold in Japan ...
Although of fundamental importance, the scientific community lacks a clear picture of energetic collision cascades in molecular solids, an important application of the high-energy bombardment of solids is Secondary Ion Mass Spectrometry