bias

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Related to forward bias: Reverse bias

bias

 [bi´as]
1. (in a measurement process) systematic error.
2. any influence or action at any stage of a study that systematically distorts the findings.
3. (of a statistical estimator) the difference between the expected value of the estimator and the true parameter value.

bi·as

(bī'-as),
1. Systematic discrepancy between a measurement and the true value; may be constant or proportionate and may adversely affect test results.
2. Any trend in the collection, analysis, interpretation, publication, or review of data that can lead to conclusions that differ systematically from the truth; deviation of results or inferences from the truth, or processes leading to deviation.
[Fr. biais, obliquity, perh. fr. L. bifax, two-faced]

There is no imputation of prejudice, partisanship, or other subjective or emotional factor such as an investigator's desire to achieve a particular outcome. More than 100 varieties of bias have been described, but all fall into a small number of classes: 1. Systematic one-sided variation of measurements from the true value. SYN systematic error, instrumental error 2. Variation of statistical summary measures (means, rates, measures of association) from their true values as a result of systematic variation of measurements, other flaws in data collection, or flaws in study design or analysis. 3. Deviation of inferences from the truth as a result of flaws in study design, data collection, or the analysis or interpretation of results. 4. A tendency of procedures in study design, data collection, analysis, interpretation, review or publication, to yield results or conclusions that depart from the truth. 5. Prejudice leading to the conscious or subconscious selection of study procedures that depart from the truth in a particular direction, or to one-sidedness in interpretation of results. This last form of bias can arise as a result of shoddy scientific methods or deliberate misrepresentation of the truth by investigators.

bias

Epidemiology Deviation of results or inferences from the truth, or processes leading to such systematic deviation; any trend in the collection, analysis, interpretation, publication, or review of data that can lead to conclusions that are systematically incorrect

bi·as

(bī'ăs)
1. Systematic discrepancy between a measurement and the true value; may be constant or proportionate and may adversely affect test results.
2. Any trend in the collection, analysis, interpretation, publication, or review of data that can lead to conclusions that differ systematically from the truth; deviation of results or inferences from the truth, or processes leading to deviation.
[Fr. biais, obliquity, perh. fr. L. bifax, two-faced]

bi·as

(bī'ăs)
1. Systematic discrepancy between a measurement and the true value; may be constant or proportionate and may adversely affect test results.
2. Any trend in the collection, analysis, interpretation, publication, or review, which can lead to conclusions that differ systematically from the truth; deviation of results or inferences from the truth, or processes leading to deviation.
[Fr. biais, obliquity, perh. fr. L. bifax, two-faced]
References in periodicals archive ?
According to the thermionic emission theory, the forward bias I-V characteristics of a Schottky diode with a series resistance can be approximately expressed as
[36], in forward bias, the series resistance [R.sub.s-For] could be obtained by direct application of the well known curves of [epsilon]' - [epsilon]" because of the addition of several different resistances: contact resistance, substrate sheet resistance, electrical resistance of the paste, and resistance of all wires of the cell.
3, [[PHI].sub.Bo] and n values were derived from the slope and y-intercept of linear section of I-V curves in the forward bias region (V < 1 V), respectively.
The values used for forward bias are [R.sub.s] = 3 [OMEGA] and [L.sub.s] = 0.3 nH, while for reverse bias [C.sub.t] = 0.15 pF is added to the [R.sub.s]-[L.sub.s] series circuit.
As is shown in Figure 4(a), the light emission is too low to be detected when the forward bias is below 2 V.
where [[PHI].sub.b,0] is the barrier height at zero bias (6), [A.sup.*] is the effective Richardson constant and equals to 32A x [cm.sup.-2]x[K.sup.-2] for p-type Si, A is the diode active area, and n is the ideality factor which is a measure of conformity of the diode to pure thermionic emission, and it is determined from the slope of the straight line region of the forward bias ln I-V characteristics.
The model accommodates forward bias with the junction leakage resistance, [R.sub.j](v).
Hiller, "Temperature Effect on PIN Diode Forward Bias Resistance," Solid State Electronics, Vol.
It exhibits an ohmic resistance of 3 [OMEGA] and intrinsic capacitance of 0.1 pF for forward bias while exhibits 2.7 K ohm and 9 pFat 0 V.
The ZnO:YAG/silicon nanostructure diode has a turn-on forward bias of ~5V.
This improvement can be attributed to more uniform current conduction supported by the emitter/base forward bias of the substrate/gate connection mechanism.
In the case of director-type antennas, the radiation is stronger in the +x direction ([PHI] = 0[degrees]) under forward bias conditions, while such a pattern symmetrically changes under reverse bias conditions, radiating stronger in the -x direction ([PHI] = 90[degrees]).

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