Tenders are invited for Field Emission Electron
It also has a new field emission electron
gun with a vacuum 100X greater than conventional field emission guns (3 x [10.
FEI's Quanta 650 FEG scanning electron microscope offers a field emission electron
source and three imaging modes--high vacuum, low vacuum and ESEM--to provide an enhanced combination of performance and versatility over a range of samples.
Tokyo, Jan 31, 2012 - (JCN Newswire) - Hitachi Ltd and Hitachi High-Technologies Corporation today announced they had received the IEEE Milestone for Hitachi's pioneering development of the world's "First Practical Field Emission Electron
Microscope, 1972" from the IEEE, the world's largest professional association in the electrical, electronics, information and communications engineering fields.
Another new entrant in this field is Novelx, which has recently begun shipment of the mySEM, which is distinguished by its field emission electron
The new microscope replaces two older units and provides a high-intensity field emission electron
source and state-of-the-art electron optics.
They then took video images of vortex patterns using a 300-kilovolt field emission electron
Silicon-based microfabrication techniques enable Agilent to design and fabricate a miniature electrostatic electron beam column combined with a field emission electron
source for the 8500.
This all-electrostatic column, when coupled with a thermal field emission electron
source, is optimized for low-voltage imaging and sub-10-nm resolution.
The Quanta 50 Series will be available in April 2009, and includes cost-effective tungsten and high-performance field emission electron
The design of the NanoESCA combines a photo emission electron
microscope (PEEM) with a new type of band pass energy filter.
The recent development of SEMs that can operate at higher pressures (poor vacuum) or with field emission electron
guns (FEGs) has extended their suitability to a wider range of samples and applications, such as hydrated and insulating samples, and applications where features as small as 10 A need to be studied.