Binet-Simon Intelligence Scale Test

Binet-Simon Intelligence Scale Test

A test that gauges intellectual capacity. Developed in 1905 by Victor Henri, Théodore Simon and Alfred Binet, it was originally intended to identify mental retardation in school children. The test is comprised of a series of questions and problems grouped for applicability up to age 16. Some questions are verbal, others require only recognition of form or manual skills; scores are in terms of mental age. In 1916 the Stanford group, under psychologist Lewis Terman, revised the Binet-Simon scale, which resulted in the Stanford-Binet Intelligence Scales, which became the US standard for decades.
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