Auger electron


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Aug·er e·lec·tron

(awg'ĕr),
an electron ejected from an orbital by photoelectric interaction with a photon emitted when another electron, in a higher energy orbital, passed from a higher to a lower energy level; the Auger electron recoils with energy equal to the characteristic radiation less the difference in shell- binding energies. See: photoelectric effect, transition electron.
[Pierre-Victor Auger]
References in periodicals archive ?
Auger electron spectroscopy helped in understanding the nature of these surface layers.
However, the energy shift observed in the Auger electrons in Figure 2(a) hides details that are revealed by the second derivative method, as shown in Figure 3, adopting the method described in [6] but using the Savitzky-Golay smoothing procedure.
Auger electron spectroscopy of grain boundary segregation of impurities was performed after irradiation at 400[degrees]C.
Auger electron spectroscopy data were collected on PHI 680 Auger nanoprobe equipped with a field emission electron gun and a cylindrical mirror kinetic energy analyzer.
Allen, "Multifunctional block copolymer micelles for the delivery of 111in to EGFR-positive breast cancer cells for targeted Auger electron radiotherapy," Molecular Pharmaceutics, vol.
In general, the energetic position of an Auger electron peak is a characteristic of the element (i.e., the binding energies of the three electronic states involved) and its chemical state.
The energy imparted to the Auger electron is dependent on the position of the electron energy levels involved.
Auger electron spectra depth profile of [Al.sub.2][O.sub.3] film with and without NiAl buffer layer after 600[degrees]C test are given in Figure 4.
The Microlab 350 from Thermo VG Scientific is another combined instrument, incorporating auger electron spectrometry, x-ray photoelectron spectroscopy, and reflected EELS.
An examination of the surface using Auger Electron Spectroscopy indicated that high levels of nickel and oxygen were present compared to as-plated samples.
While EDX provides useful composition information for relatively large particles, Auger electron spectroscopy (AES) is more conclusive for compositional analysis of defects in the submicron size range.
We determine such structures by Low Energy Electron Diffraction (LEED) and Auger Electron Spectroscopy (AES), after contamination-free transfer from solution to vacuum in a custom-designed apparatus.