secondary ion mass spectrometry


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secondary ion mass spectrometry

A technique of mass spectrometry in which a beam of energised ions (appoximately 5 keV in energy) is used to sputter sample atoms and molecules from a thin solid film or surface (classic SIMS), or organic molecules that may be present as a thin film or dissolved in a liquid or solid solution (molecular SIMS or liquid SIMS) held on the surface of a beam-intersecting sample probe.
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The Growth of Secondary Ion Mass Spectrometry (SIMS): A Personal View of Its Development," in SIMS V, Benninghoven, A.
Vickerman, Handbook of Static Secondary Ion Mass Spectrometry (SIMS), Wiley, Chichester, U.
We used three microbeam techniques, electron probe microanalysis (EPMA), laser ablation inductively coupled-mass spectrometry (LA ICP-MS), and secondary ion mass spectrometry (SIMS) to determine (to first order) the minor and trace element characteristics of the glasses.
As of August, Millbrook Instruments had sold 11 of its chemical microscopes, which utilize secondary ion mass spectrometry, including two sold in Japan .
Although of fundamental importance, the scientific community lacks a clear picture of energetic collision cascades in molecular solids, an important application of the high-energy bombardment of solids is Secondary Ion Mass Spectrometry (SIMS).
Secondary ion mass spectrometry (SIMS) is an analytical technique that is used in many fields of research.
17 Secondary Ion Mass Spectrometry - a Powerful Tool for Studying Elemental Distributions over Various Length Scales
Contract Awarded for Focused ION Beam Scanning Electron Microscope (FIB SEM) with Time-of-Flight Secondary ION Mass Spectrometry (TOF-SIMS
He covers properties of atoms, ions, molecules, and solids; sputtering and ion formation; instrumentation used in secondary ion mass spectrometry, and data collection and processing.
They discuss such aspects as secondary ion mass spectrometry depth profiling for hydration dating, temperature corrections for hydration dating, new perspectives on obsidian procurement and exchange at Tiwanaku in Bolivia, a compositional study of glass vessels from Mtwapa in Kenya, the characterization and provenance of archaeological glass artifacts from mainland and Aegean Greece.
Using secondary ion mass spectrometry, the researchers measured the samples' 'water signatures', which tell the possible origin of the water-and made the surprising discovery that the water on the Earth and moon are different.
His instructions for analysis include x-ray spectroscopy for elemental analysis, electron spectroscopy and secondary ion mass spectrometry for surface analysis, vibration spectroscopy for molecular analysis and thermal analysis.

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