secondary ion mass spectrometry


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secondary ion mass spectrometry

A technique of mass spectrometry in which a beam of energised ions (appoximately 5 keV in energy) is used to sputter sample atoms and molecules from a thin solid film or surface (classic SIMS), or organic molecules that may be present as a thin film or dissolved in a liquid or solid solution (molecular SIMS or liquid SIMS) held on the surface of a beam-intersecting sample probe.
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The Growth of Secondary Ion Mass Spectrometry (SIMS): A Personal View of Its Development," in SIMS V, Benninghoven, A.
We used three microbeam techniques, electron probe microanalysis (EPMA), laser ablation inductively coupled-mass spectrometry (LA ICP-MS), and secondary ion mass spectrometry (SIMS) to determine (to first order) the minor and trace element characteristics of the glasses.
Time-of-flight secondary ion mass spectrometry (ToF-SIMS) is a non-destructive surface analysis technique used to examine the top layer of a material.
Recently, there has been considerable interest in the use of polyatomic cluster ions in organic secondary ion mass spectrometry because they have been shown to increase the yield of desorbed molecular ions by an order of magnitude or more.
Manufacture, delivery, installation, testing, referral, including staff training equipment secondary ion mass spectrometry - SIMS.
The topics include building and destroying continental mantle, using time-of-flight secondary ion mass spectrometry to study biomarkers, paleoecologic megatrends in marine metazoa, learning to read the chemistry of regolith to understand the critical zone, the evolution of grasses and grassland ecosystems, and ice age Earth rotation.
Time-of-flight secondary ion mass spectrometry (ToF-SIMS) can be used to conduct surface studies of solid materials.
RBS is often found in laboratories that use secondary ion mass spectrometry (SIMS) and Auger electron spectrometry.
This market covers the following equipment types: Focused Ion Beam, Broad Ion Milling, Secondary Ion Mass Spectrometry, Energy Dispersive X-Ray Spectroscopy, Reactive Ion Etching, Ion Milling, Chemical Mechanical Planarization and related equipment markets for Electron and Scanning Probe Microscopy.
Tenders are invited for Supply,Inspection And Warranty Of Portable Dehumidifiers For Secondary Ion Mass Spectrometry (Sims) Laboratory As Per Following Specifications : Dehumidifier Is Required For A Room (Volume 1700 Cubic Feet) Under Ambient Conditions Such As Relative Humidity Greater Than 80%, Temperature 18 - 28 Degree Centigrade, Required Relative Humidity After Conditioning : 50% - 60%, Should Have Inbuilt Water Tank With Capacity Greater Than 6 Litres, Full Water Tank Warning Signal, Noise Level Less Than 55 Db, Easier Mobility With Convenient Wheels, Voltage/Frequency (Volts/Hz) : 220-240v, 50 Hz
In secondary ion mass spectrometry (SIMS), a beam of primary ions strikes the surface of the sample.
Their products include secondary ion mass spectrometry (SIMS), low-energy X-ray emission spectrometry (LEXES), tomographic atom probe (TAP), and electron probe microanalysis (EPMA) instrumentation," adds Mr.

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