scanning electron microscope


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Related to scanning electron microscope: Transmission electron microscope

microscope

 [mi´kro-skōp]
an instrument used to obtain an enlarged image of small objects and reveal details of structure not otherwise distinguishable.
The light path of a darkfield microscope. From Hart and Shears, 1997.
acoustic microscope one using very high frequency ultrasound waves, which are focused on the object; the reflected beam is converted to an image by electronic processing.
binocular microscope one with two eyepieces, permitting use of both eyes simultaneously.
compound microscope one consisting of two lens systems whereby the image formed by the system near the object is magnified by the one nearer the eye.
darkfield microscope one so constructed that illumination is from the side of the field so that details appear light against a dark background.
electron microscope one in which an electron beam, instead of light, forms an image for viewing, allowing much greater magnification and resolution. The image may be viewed on a fluorescent screen or may be photographed. Types include scanning and transmission electron microscopes.
fluorescence microscope one used for the examination of specimens stained with fluorochromes or fluorochrome complexes, e.g., a fluorescein-labeled antibody, which fluoresces in ultraviolet light.
light microscope one in which the specimen is viewed under ordinary illumination.
operating microscope one designed for use in performance of delicate surgical procedures, e.g., on the middle ear or small vessels of the heart.
phase microscope (phase-contrast microscope) a microscope that alters the phase relationships of the light passing through and that passing around the object, the contrast permitting visualization of the object without the necessity for staining or other special preparation.
scanning electron microscope (SEM) an electron microscope that produces a high magnification image of the surface of a metal-coated specimen by scanning an electron beam and building an image from the electrons reflected at each point.
simple microscope one that consists of a single lens.
slit lamp microscope a corneal microscope with a special attachment that permits examination of the endothelium on the posterior surface of the cornea.
stereoscopic microscope a binocular microscope modified to give a three-dimensional view of the specimen.
transmission electron microscope (TEM) an electron microscope that produces highly magnified images of ultrathin tissue sections or other specimens. An electron beam passes through the metal-impregnated specimen and is focused by magnetic lenses into an image.
x-ray microscope one in which x-rays are used instead of light, the image usually being reproduced on film.

scan·ning e·lec·tron mi·cro·scope

a microscope in which the object in a vacuum is scanned in a raster pattern by a slender electron beam, generating reflected and secondary electrons from the specimen surface that are used to modulate the image on a synchronously scanned cathode ray tube; with this method a three-dimensional image is obtained, with both high resolution and great depth of focus.

scanning electron microscope (SEM)

an instrument similar to an electron microscope in that a beam of electrons is used to scan the surface of a specimen. The beam is moved in a point-to-point manner over the surface of the specimen. These electrons are deflected, collected, accelerated, and directed against a scintillator. The large number of photons thus created are converted into an electric signal that, in turn, modulates the beam scanning the surface of the specimen. The image produced appears to be three-dimensional and lifelike. Compare electron microscope, transmission scanning electron microscope.

scan·ning e·lec·tron mi·cro·scope

(skan'ing ĕ-lek'tron mī'krŏ-skōp)
A microscope in which the object in a vacuum is scanned in a raster pattern by a slender electron beam, generating reflected and secondary electrons from the specimen surface that are used to modulate the image on a synchronously scanned cathode ray tube; with this method a three-dimensional image is obtained, with both high resolution and great depth of focus.

scanning electron microscope

see ELECTRON MICROSCOPE.

scan·ning e·lec·tron mi·cro·scope

(skan'ing ĕ-lek'tron mī'krŏ-skōp)
A microscope in which the object in a vacuum is scanned in a raster pattern by a slender electron beam, generating reflected and secondary electrons from the specimen surface that are used to modulate the image on a synchronously scanned cathode ray tube; with this method a three-dimensional image is obtained, with both high resolution and great depth of focus.

scanning electron microscope (SEM),

References in periodicals archive ?
Contract award notice: Scanning electron microscopes
UNIVERSITEIT MAASTRICHT announced tender for Contract notice: Scanning electron microscope (sem).
NIST has a new field-emission scanning electron microscope (FE-SEM) capable of high spatial resolution microstructural characterization of a wide variety of metal, ceramic, and polymer structures.
The researchers placed the epoxy casts under a scanning electron microscope and took pictures of minute scratches and pits etched into teeth during the study period.
All these measurements are accomplished simultaneously, with excellent correlation to CD Scanning Electron Microscope (CD-SEM) and Atomic Force Microscope (AFM) results.
Procurement of a Scanning Electron Microscope (SEM) to equip the clean room at the Campus of IST Austria.
Improved software for constructing predicted scanning electron microscope (SEM) images of line features has been produced.
Using a computer-controlled scanning electron microscope, the researchers drew up a list of the minerals and elements in each sample.
Contract notice for Supply of Scanning electron microscope in combination of a focused ion beam.
D'Errico, of the Institute of Human Paleontology in Paris, France, studied experimental marks on limestone pebbles under a scanning electron microscope and found it possible to tell the direction in which incised lines were made, the order in which they were made and whether the same tool produced all the marks.
Supplying a scanning electron microscope of field emission.

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