parametric test

par·a·met·ric test

a statistical test that depends on an assumption about the distribution of the data, for example, that the data are normally distributed.

parametric test

A statistical test or procedure using a quantitative measure—standard error, standard deviation, mean square error of variability or spread—in the data to establish a p-value (t-tests, ANOVA). Parametric tests assume that the distribution of the observations or datapoints is known. For a parametric test to produce valid p-values, the data must have a Gaussian ("normal") distribution.

parametric test

A test or trial that depends on the assumption that the date involved are normally distributed.
References in periodicals archive ?
6) for the Keithley S530 Parametric Test System that can reduce measurement speed by as much as 25 percent.
While a recent paper demonstrated that a parametric test is superior to an absolute threshold for classifying physicians as lower or higher cost, the authors suggest that a nonparametric test would be preferable (Adams et al.
The Windows-compatible ACS Basic Edition package provides control and analysis tools well-suited for high power device characterization, including complete parametric test libraries for MOSFETs, BJTs, triacs, diodes, IGBTs, and other device types.
ACS supports a wide range of Keithley instrumentation, as well as Keithley's S500 and S530 Parametric Test systems.
a world leader in advanced electrical test instruments and systems, continues to enhance the capabilities of its S530 Parametric Test Systems, the semiconductor industry's most cost-effective solution for high speed production parametric test.
Design and development of a parametric test campaign (using an air bearing table ) for testing the chosen sampling tools/strategies with a range of representative soil analogues.
a world leader in advanced electrical test instruments and systems, today introduced several enhancements to its line of S530 Parametric Test Systems, the most cost-effective fully automatic production parametric test solutions available to the semiconductor industry.
3 is designed for use with Keithley's S530 Parametric Test Systems, the company's fastest, most cost-effective line of process control monitoring solutions to date.
As wafer manufacturers continue to strive to maximize the die yield per wafer by reducing the width of scribe lines located between functional die, shrinking probe pads on parametric test structures are becoming increasingly difficult to contact.
The dynamic growth of these high-speed interface circuits and the rapid increase in both data rates and lane counts have created a need for a low cost parametric test for applications that include PCI Express, Ethernet, SATA and a number of other high-speed serial I/O standards.
The dynamic growth of these high-speed interface circuits and the rapid increase in both data rates and lane counts have created a need for a low-cost parametric test for applications that include PCI Express, Ethernet, SATA and a number of other high-speed serial I/O standards.
This one-hour seminar will identify, discuss, and propose solutions for a number of challenges related to high voltage wafer level parametric test.