To give a bit of background: A parametric test
is a statistical test that is generally used when the data conforms to certain assumptions.
Tenders are invited for Parametric Test
System For Dc Auto Probing-01 No.
Rohit Trivedi, will cover introduction to research and problem formulation, research process and research design, sampling theory, hypothesis formulation and testing techniques, non-parametric and parametric test
, multivariate analysis, data mining and business intelligence, use of SPSS and AMO in data analysis.
In conjunction with PXI 3000 RF instrumentation and the existing LTE FDD measurement suite, Aeroflex can now offer comprehensive RF parametric test
capability for LTE devices operating in LTE 3GPP TDD and FDD bands.
The first Keithley products resulting from this partnership are the model S400DC/RF and S600DC/RF ATE systems, the industry's first single-insertion radio frequency (RF) and direct current (DC) parametric test
solutions for probing wafer level communications and high-speed digital devices.
The S530 Parametric Test
Systems now offer enhanced capabilities.
This agreement will enable STAr Technologies' Virgo-DC/RF probe cards to provide a precision single-pass DC and RF parametric test
capability, thus enabling precision DC and RF parametric tests
with a single tester and probe station to reduce the total cost of test for advanced telecommunication devices.
manufacturer of semiconductor on-wafer high-frequency and parametric test
systems is following this trend with the introduction of its Nucleus Autoprobe 1.
a world leader in advanced electrical test instruments and systems, continues to enhance the capabilities of its S530 Parametric Test
Systems, the semiconductor industry's most cost-effective solution for high speed production parametric test
Test Time Parametric Test
Name ~Test Time Savings Failure Noise, NF, SNR 100 ms IQ Phase Imbalance 5 ms IQ Amplitde Imbalance 5 ms Phase Noise 100 ms EVM (Traditional) 300 ms EVM (Production) 50 ms 76.
Keithley Instruments has published Parallel Test Technology: The New Paradigm for Parametric Testing, a 60-page semiconductor parametric test
handbook offering an overview of the emerging test technique known as parallel parametric testing, a strategy for wafer-level parametric testing that uses concurrent execution of multiple tests on multiple scribe line test structures and helps semiconductor fabs maximize their test throughput and reduce their cost of test.
The model S600DC/RF automated parametric test
(APT) system is designed for integrated DC and RF wafer measurements.