metrology


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me·trol·o·gy

(mĕ-trol'ŏ-jē)
1. The science of weights and measures.
2. The arithmetic of pharmacy and its application to dosage, preparation, compounding, and dispensing of medication.
[G. metron, measure, + logos, study]

metrology

The science and technology of measurement (e.g., of body parts or chemical reagents).

metrology

the study of weights and measures used in prescription writing.
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Some of the leading vendors of the metrology software include AICON 3D Systems GmbH, 3D Systems Corporation, Carl Zeiss Industrial Metrology, Hexagon Metrology Inc.
Under the terms of the global OEM agreement Nikon will sell, market, train and support Verisurf software when bundled with Nikon Metrology devices.
As 2007 begins, we see fabs aggressively running higher throughput tools and processes that, in turn, require Tevet's integrated metrology to keep up with their fastest processes while providing every-wafer measurement and detection.
provides semiconductor metrology solutions for thin films based on novel, rapid, non-contacting, and non-destructive x-ray technology.
Tevet entered the market by targeting process steps that were unserved or underserved by existing metrology because of its inherent inability to measure fast enough or close enough to the process chamber.
Implementation of Matchbox methodology improves the cost of ownership and offers a rapid return on investment by increasing the metrology throughput by up to 20%, meaning an immediate "zero-footprint" capacity expansion over a fleet of tools in the fab.
NASDAQ:TWAV), a worldwide leader in the development, production and sale of process control metrology systems used in the manufacture of semiconductors, today announced the Company has received a multi-million dollar, multi-tool order for Therma-Wave's leading edge Opti-Probe(R) thin-film measurement and Therma-Probe(R) implant monitoring products.
Nasdaq: VECO), announced today that it has introduced the Dimension(R) Atomic Force Profiler (AFP), designed for a broad range of metrology applications in the semiconductor fab.
a manufacturer of advanced metrology equipment, announced the shipment of 12 units of the n&k 1500-D systems for process control of perpendicular recording media.
NASDAQ:TWAV), a worldwide leader in the development, manufacture and sale of process control metrology systems used in the production of semiconductors, today announced the Company has received a multi-million dollar, multi-tool order from a Japanese commodity device manufacturer for its Opti-Probe(R) 7341XP thin-film and critical dimension (CD) metrology systems.
a TEL company, announces the release of their Optical Digital Profilometry - Mask (ODP-M) metrology product, TeraGen-M 2.