Some of the leading vendors of the metrology
software include AICON 3D Systems GmbH, 3D Systems Corporation, Carl Zeiss Industrial Metrology
, Hexagon Metrology
Under the terms of the global OEM agreement Nikon will sell, market, train and support Verisurf software when bundled with Nikon Metrology
As 2007 begins, we see fabs aggressively running higher throughput tools and processes that, in turn, require Tevet's integrated metrology
to keep up with their fastest processes while providing every-wafer measurement and detection.
provides semiconductor metrology
solutions for thin films based on novel, rapid, non-contacting, and non-destructive x-ray technology.
Tevet entered the market by targeting process steps that were unserved or underserved by existing metrology
because of its inherent inability to measure fast enough or close enough to the process chamber.
Project to Develop 300mm X-Ray Metrology
Platform for Back End of Line (BEOL) Copper/Low K Process
Implementation of Matchbox methodology improves the cost of ownership and offers a rapid return on investment by increasing the metrology
throughput by up to 20%, meaning an immediate "zero-footprint" capacity expansion over a fleet of tools in the fab.
NASDAQ:TWAV), a worldwide leader in the development, production and sale of process control metrology
systems used in the manufacture of semiconductors, today announced the Company has received a multi-million dollar, multi-tool order for Therma-Wave's leading edge Opti-Probe(R) thin-film measurement and Therma-Probe(R) implant monitoring products.
Nasdaq: VECO), announced today that it has introduced the Dimension(R) Atomic Force Profiler (AFP), designed for a broad range of metrology
applications in the semiconductor fab.
a manufacturer of advanced metrology
equipment, announced the shipment of 12 units of the n&k 1500-D systems for process control of perpendicular recording media.
NASDAQ:TWAV), a worldwide leader in the development, manufacture and sale of process control metrology
systems used in the production of semiconductors, today announced the Company has received a multi-million dollar, multi-tool order from a Japanese commodity device manufacturer for its Opti-Probe(R) 7341XP thin-film and critical dimension (CD) metrology
a TEL company, announces the release of their Optical Digital Profilometry - Mask (ODP-M) metrology
product, TeraGen-M 2.