I-V


Also found in: Acronyms.

I-V

Abbreviation for intraventricular.
References in periodicals archive ?
Forward-biased I-V measurements of the solar cell are made under controlled illumination.
The leakage current and shunt resistance can be derived from the reverse-biased I-V data.
Whether or not trap effects are significant, the ability to make isothermal measurements is an advantage of pulsed I-V for any device where self-heating can be expected to affect the I-V behavior.
As demonstrated with several in-house research systems, (1-4) pulsed I-V measurements can be setup to use a low duty cycle pulse of a duration such that both the traps and the device thermal condition are held at a quiescent DC bias point.
Typical examples of Ultra-Fast I-V on sample devices
Tips, Tricks, and Traps in Ultra-Fast I-V Semiconductor Characterization is intended for those whose job requires performing all types of characterization measurements.
a leader in semiconductor device characterization and parametric test, offers customers around the world a variety of flexible solutions for current-voltage (I-V), capacitance-voltage (C-V), and pulsed I-V measurements and analysis.
For more information on the new I-V, C-V, and Pulse Cabling Kits or any of Keithley's other semiconductor test solutions, visit www.
Unlike other modular test systems, the Model 4500-MTS Multi Channel I-V Test System is optimized for low noise, high current sourcing, while maintaining a well-controlled environment for sensitive measurements.
Each channel of a Model 4510 or 4511 Quad I-V Card offers a high power current source sub-channel, a low power voltage source sub-channel, and a 5-1/2 digit analog-to-digital converter for reading a DUT's response to the source stimulus.
A Simple Solution for I-V Curves or Continuous Current
The Model 2182, when used with an external current source, is optimized to provide I-V curves without the use of a computer controller.